X-Ray Peak Profiles for Ultramicrotomed Powders and Their Relation to the Deformation Structure
- 1 July 1968
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 39 (8) , 3587-3592
- https://doi.org/10.1063/1.1656829
Abstract
X‐ray peak profiles of microtomed powders have been measured. The results for peak shifts and for peak asymmetries have been related to observations by transmission electron microscopy. The validity of the assumptions that have been made to calculate the relationship between peak profiles and stacking faults or twin faults is discussed.This publication has 14 references indexed in Scilit:
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