An investigation of the analytical capabilities of X-ray emission induced by high energy alpha particles
- 1 May 1971
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 93 (1) , 69-76
- https://doi.org/10.1016/0029-554x(71)90139-x
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970
- Study of the Production ofX Rays in Ca, Ti, and Ni by 2-28-MeV ProtonsPhysical Review A, 1970
- Application of High-Resolution Semiconductor Detectors in X-ray Emission SpectrographyScience, 1966
- -Ionization Cross Sections for Relativistic ElectronsPhysical Review B, 1964
- A NEW MATERIAL AND TECHNIQUES FOR THE FABRICATION AND MEASUREMENT OF VERY THIN FILMS FOR USE IN 4π-COUNTINGCanadian Journal of Chemistry, 1955