Normalization of wave functions in an MIS structure
- 30 June 1972
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 15 (6) , 723-725
- https://doi.org/10.1016/0038-1101(72)90015-9
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Quantum mechanical calculation of the carrier distribution and the thickness of the inversion layer of a MOS field-effect transistorSolid-State Electronics, 1970
- Electrical Conductivity in an n-Type Surface Inversion Layer of InSb at Low TemperatureJournal of Applied Physics, 1969
- Mobility Anisotropy and Piezoresistance in Silicon p-Type Inversion LayersJournal of Applied Physics, 1968
- Properties of Semiconductor Surface Inversion Layers in the Electric Quantum LimitPhysical Review B, 1967