Design of Testable CMOS Logic Circuits Under Arbitrary Delays
- 1 July 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 4 (3) , 264-269
- https://doi.org/10.1109/tcad.1985.1270122
Abstract
The sequential behavior of CMOS logic circuits in the presence of stuck-open faults requires that an initialization input followed by a test input be applied to detect such a fault. However, a test set based on the assumption that delays through all gates and interconnections are zero, can be invalidated in the presence of arbitrary delays in the circuit. In this paper, we will present a necessary and sufficient condition for the existence of a test set, which cannot be invalidated under arbitrary delays, for an AND-OR or OR-AND CMOS realization for any given function. We will also introduce a Hybrid CMOS realization which, for any given function, is guaranteed to have a valid test set under arbitrary delays.Keywords
This publication has 4 references indexed in Scilit:
- Test Generation for MOS Circuits Using D-AlgorithmPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983
- On Fault Detection in CMOS Logic NetworksPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983
- Automatic Test Generation for Stuck-Open Faults in CMOS VLSIPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1981
- Fault Modeling and Logic Simulation of CMOS and MOS Integrated CircuitsBell System Technical Journal, 1978