Positron reemission studies of the growth and defects of palladium overlayers on Cu(100)

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Abstract
The growth and annealing properties of Pd overlayers on Cu(100) have been investigated using reemitted positron spectroscopy, electron work function, Auger electron spectroscopy, low-energy electron diffraction, and Rutherford backscattering spectroscopy. Changes in the overlayer growth mode have been observed at ∼0.5- and ∼1-ML Pd coverages, corresponding to the completion of the first and second alloy layers, the latter also being associated with the beginning of the growth of bulk Pd. For 0.5-ML Pd overlayers, the annealing of the alloy surface defects has been observed at 353 K to have a characteristic time constant of τ=82±5 min. These studies represent a detailed correlation between the positron reemission yield and surface morphology and defects.