X-ray photoelectron spectroscopic studies on yttria-stabilized zirconia and its surface transformations
- 1 December 1991
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 206 (1-2) , 349-354
- https://doi.org/10.1016/0040-6090(91)90449-8
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- XPS studies on passivated and degraded YBa2Cu3O7−x filmsPhysica C: Superconductivity and its Applications, 1989
- An XPS study of hydrogen implanted zirconiumJournal of the Less Common Metals, 1987
- Electron beam reduction of cubic Y-doped ZrO2(100): A study by X-ray photoelectron spectroscopyJournal of Solid State Chemistry, 1987
- Tetragonal zirconia polycrystal (TZP)—A reviewInternational Journal of High Technology Ceramics, 1987
- An investigation of air-grown yttrium oxide and experimental determination of the sputtering yield and the inelastic mean free pathApplied Surface Science, 1986
- Auger and core level electron energy loss studies of (Y2O3)m(ZrO2)1−m single crystal surfacesJournal of Vacuum Science & Technology A, 1985
- X-ray photoelectron spectroscopy of rare-earth compoundsJournal of Electron Spectroscopy and Related Phenomena, 1984
- AES/STEM grain boundary analysis of stabilized zirconia ceramicsJournal of Physics and Chemistry of Solids, 1983
- Auger and photoelectron line energy relationships in aluminum–oxygen and silicon–oxygen compoundsJournal of Vacuum Science and Technology, 1982
- ESCA studies of naturally passivated metal foilsJournal of Vacuum Science and Technology, 1977