Production of soft X-ray emitting slow multiply charged ions: Recoil ion spectroscopy
- 18 April 1977
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 61 (2) , 107-110
- https://doi.org/10.1016/0375-9601(77)90852-0
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Infrared-X-Ray Double-Resonance Study ofSplitting in Hydrogenic FluorinePhysical Review Letters, 1975
- Beam–foil spectroscopy of neon between 80 and 350 ÅJournal of the Optical Society of America, 1975
- Multiplet effects in high resolution Ne Kσ structurePhysics Letters A, 1974
- Neon,satellite structure induced by 80-MeV argon-ion impactPhysical Review A, 1974
- Exponential Projectile Charge Dependence ofandX-Ray Production by Fast, Highly Ionized Argon Beams in Thin Neon TargetsPhysical Review Letters, 1973