Exponential Projectile Charge Dependence ofandX-Ray Production by Fast, Highly Ionized Argon Beams in Thin Neon Targets
- 25 June 1973
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 30 (26) , 1289-1292
- https://doi.org/10.1103/physrevlett.30.1289
Abstract
Yields of projectile and target x rays from collisions between ∼ 80-MeV argon ions and thin neon targets increase dramatically as the projectile charge is increased from +6 to +17. Although incrementing the projectile charge state amounts to "tuning" projectile -shell energy through target -shell energy, the 60-fold (∼exponential) increase in target yield and the more than 1000-fold (>exponential) increase in projectile yield can be partially understood as the effect of a rapidly changing fluorescence yield, but not as an energy-level-matching effect.
Keywords
This publication has 11 references indexed in Scilit:
- Dynamic Screening of Projectile Charges in Solids Measured by Target X-Ray EmissionPhysical Review Letters, 1973
- Theoretical-Shell Fluorescence Yield of Multiply Ionized NeonPhysical Review Letters, 1973
- Effect of Multiple Ionization on the Fluorescence Yield of NePhysical Review Letters, 1972
- Projectile Structure Effects on NeonX-Ray Production by Fast, Highly Ionized Argon BeamsPhysical Review Letters, 1972
- Dependence of X-Ray Yields in Argon, Krypton, and Xenon upon the Charge State of Fluorine Ions at 35.7 MeVPhysical Review Letters, 1972
- X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition ProbabilitiesReviews of Modern Physics, 1972
- A general description of K X-ray de-excitation of titaniumPhysics Letters A, 1972
- X-Ray Production by Alpha-Particle ImpactPhysical Review A, 1971
- Charge state dependence of X-ray and Auger electron emission spectra for rare-gas atoms. II. The neon atomJournal of Physics B: Atomic and Molecular Physics, 1971
- X-Ray Production in Ion-Atom Collisions: The Influence of Level MatchingPhysical Review Letters, 1970