Overview of soft-x-ray photoemission spectromicroscopy
- 1 May 1990
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 291 (1-2) , 26-35
- https://doi.org/10.1016/0168-9002(90)90028-5
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
- Development Of A Normal Incidence Multilayer, Imaging X-Ray MicroscopePublished by SPIE-Intl Soc Optical Eng ,1989
- Possibility of a resonating-valence-bond state in the high- superconductorPhysical Review B, 1989
- Theoretical and experimental analysis of the superconducting transition effects on the Fermi-edge photoemission spectraPhysical Review B, 1989
- Photoelectron microscopy with synchrotron radiationReview of Scientific Instruments, 1988
- Maximum: A scanning photoelectron microscope at AladdinNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1988
- Scanning x-ray microscope with 75-nm resolutionReview of Scientific Instruments, 1988
- Image Formation in Multilayers Optics: the Schwartzschild ObjectivePublished by SPIE-Intl Soc Optical Eng ,1985
- X-Ray microscope using multilayer optics with a laser-produced plasma sourcePublished by SPIE-Intl Soc Optical Eng ,1985
- Design And Assembly Of A High Resolution Schwarzschild Microscope For Soft X RaysPublished by SPIE-Intl Soc Optical Eng ,1982
- Ueber die Entladung der Electricität in verdünnten GasenAnnalen der Physik, 1880