Electro-optic sampling using an external GaAs probe tip
- 16 August 1990
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 26 (17) , 1341-1343
- https://doi.org/10.1049/el:19900864
Abstract
The first laser-diode-based external electro-optic (EO) sampling using a GaAs probe tip is described. This tip is a longitudional electric field sensor, being therefore immune from optical crosstalk. The minimum detectable voltage is 16mV/√(Hz). The EO sampling is compared with that of a conventional electrical sampling oscilloscope, and the two are shown to be in excellent agreement.Keywords
This publication has 2 references indexed in Scilit:
- External electro-optic probing of millimeter-wave integrated circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A Non-contact Electro-optic Prober for High Speed Integrated CircuitsPublished by Springer Nature ,1987