External electro-optic probing of millimeter-wave integrated circuits
- 13 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 221-224
- https://doi.org/10.1109/mwsym.1989.38705
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Picosecond optical sampling of GaAs integrated circuitsIEEE Journal of Quantum Electronics, 1988
- Noncontact electro-optic sampling with a GaAs injection laserElectronics Letters, 1986
- Picosecond electro-optic sampling systemApplied Physics Letters, 1982