Scanning-tunneling-microscopy investigation of the quantum-size effect in epitaxial/Si(111)
- 15 August 1994
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 50 (8) , 5807-5809
- https://doi.org/10.1103/physrevb.50.5807
Abstract
Nearly coherent overlayers of were grown on Si(111) by molecular-beam epitaxy and examined by an in situ scanning-tunneling microscope at 77 K. The quantum-size effect in overlayers was demonstrated using scanning-tunneling microscopy. Subbands in the and energy bands along the ΓL symmetry line were observed, and the observed subband spacings agree well with independent band-structure computations.
Keywords
This publication has 25 references indexed in Scilit:
- Growth and characterization of epitaxial Ni and Co silicidesMaterials Science Reports, 1992
- Electron interferometry at a metal-semiconductor interfacePhysical Review Letters, 1992
- Probing interfacial properties with Bloch electrons: Ag on Cu(111)Physical Review B, 1989
- Quantized hole states detected by photoemission in ultrathin epitaxial CoSi2films on Si(111)Physical Review B, 1989
- Quantum size and surface effects in the electrical resistivity and high-energy electron reflectivity of ultrathin lead filmsPhysical Review B, 1988
- Electronic structure and properties ofPhysical Review B, 1988
- Electronic structure of cobalt disilicidePhysical Review B, 1988
- Electronic structure and properties ofandin the fluorite and adamantane structuresPhysical Review B, 1987
- Low-energy-electron transmission through epitaxial films: Cu(001) on Ni(001)Physical Review B, 1985
- Observation of Electron Standing Waves in a Crystalline BoxPhysical Review Letters, 1971