Measurement of residual stresses by X-ray diffraction in a Ni Nio system obtained by high temperature oxidation
- 31 October 1988
- journal article
- Published by Elsevier in Acta Metallurgica
- Vol. 36 (10) , 2779-2786
- https://doi.org/10.1016/0001-6160(88)90124-1
Abstract
No abstract availableKeywords
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