Minority-carrier lifetime and surface recombination velocity measurement by frequency-domain photoluminescence
- 1 January 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 38 (9) , 2169-2180
- https://doi.org/10.1109/16.83745
Abstract
No abstract availableThis publication has 25 references indexed in Scilit:
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