Nearly noise-free transistor operated in the 2–18 GHz range
- 19 January 1998
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 72 (3) , 368-370
- https://doi.org/10.1063/1.120739
Abstract
Temperature dependent measurements of the noise parameters of a pseudomorphic high electron mobility transistor show the minimum noise figure vanishes at low temperatures for frequencies from 2 GHz up to 18 GHz and for most currents. We propose that the exponential decrease seen in the noise figure with temperature is due to a reduction of thermally activated noise sources with an activation energy of ∼95 meV. Other noise-parameter data suggest a flattening of the noise figure paraboloid as temperature is decreased. These results demonstrate the feasibility of designing a near 0.1 dB noise figure amplifier for high-frequency operation over a wide range of currents.Keywords
This publication has 5 references indexed in Scilit:
- Development of accurate on-wafer, cryogenic characterization techniquesIEEE Transactions on Microwave Theory and Techniques, 1996
- Noise and gain comparison of 0.25 μm gate MESFETs and PHEMTs for low power wireless communication circuitsSolid-State Electronics, 1996
- On-wafer microwave measurement setup for investigations on HEMTs and high-T/sub c/ superconductors at cryogenic temperatures down to 20 KIEEE Transactions on Microwave Theory and Techniques, 1992
- Negative differential resistance through real-space electron transferApplied Physics Letters, 1979
- Noise characteristics of gallium arsenide field-effect transistorsIEEE Transactions on Electron Devices, 1974