Tunneling and thermal noise as limiting factors in microelectronics

This publication has 5 references indexed in Scilit:

• Fundamental limitations on DRAM storage capacitors
  IEEE Circuits and Devices Magazine, 1985
• Ultra-large scale integration
  IEEE Transactions on Electron Devices, 1984
• Physics and computation
  International Journal of Theoretical Physics, 1982
• Quantum-Mechanical Limitations on Device Performance
  Published by Elsevier ,1982
• Noise-induced error rate as limiting factory for energy per operation in digital ICs
  IEEE Journal of Solid-State Circuits, 1977