Heat-treatment effects on porous silicon
- 15 July 1994
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 76 (2) , 1346-1348
- https://doi.org/10.1063/1.357801
Abstract
High‐resolution scanning electron microscopy of porous silicon(PS) subjected to various annealing treatments in vacuum has revealed a spheroidal particlelike structure that only becomes clearly apparent after treatment at about 250 °C. This is consistent with recent suggestions that any quantum effects arise from particles. It is deduced that the particles have a coating that is reduced or removed on heating. The concomitant effects on the current‐voltage curves of PS, caused by annealing and also by prolonged air exposure, have been measured, and are consistent with the interpretation.This publication has 12 references indexed in Scilit:
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