Density distribution of gap states in extremely thin a-Si:H layers on crystalline silicon wafers
- 1 June 2004
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 338-340, 211-214
- https://doi.org/10.1016/j.jnoncrysol.2004.02.055
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Low-Energy Yield Spectroscopy as a Novel Technique for Determining Band Offsets: Application to theHeterostructurePhysical Review Letters, 1995
- Development of New a-Si/c-Si Heterojunction Solar Cells: ACJ-HIT (Artificially Constructed Junction-Heterojunction with Intrinsic Thin-Layer)Japanese Journal of Applied Physics, 1992
- The defect density in amorphous siliconPhilosophical Magazine Part B, 1989
- Exponential Conduction-Band Tail in P-DopedPhysical Review Letters, 1988
- Surface states and the exponential valence-band tail ina-Si:HPhysical Review B, 1987
- Energy dependence of the optical matrix element in hydrogenated amorphous and crystalline siliconPhysical Review B, 1985
- Photoelectron Spectra of Hydrogenated Amorphous SiliconPhysical Review Letters, 1977
- Hydrogen chemisorption on Si(111)Physical Review B, 1977