Radiation-Induced Response of Operational Amplifiers in Low-Level Transient Radiation Environments
- 1 January 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 34 (6) , 1442-1447
- https://doi.org/10.1109/tns.1987.4337495
Abstract
Extensive computer simulations have been performed on CMOS and bipolar operatioinal amplifiers in an attempt to obtain a better understanding of low-level transient radiation response mechanisms. The simulation methodology has been confirmed using flash X-ray data for the amplifiers studied. Variations in circuit response to loading and feedback configuration have been explored, and several generalizations can be made which may provide a useful basis for a specification methodology.Keywords
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