Terminal Modeling and Photocompensation of Complex Microcircuits
- 1 January 1972
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 19 (6) , 86-93
- https://doi.org/10.1109/tns.1972.4326813
Abstract
Results are presented on generalized approaches to derive radiation-inclusive simplified models of linear and digital microcircuits. Application of the principle of superposition allows generation of a compact small-signal model of the linear microcircuit, with extension of the model to include large-signal saturation effects. The digital microcircuit model is the combination of current-voltage terminal networks with a logical decision function to represent the truth table of the device. A factor of 20 to 50 improvement in required computer time and storage was realized with the terminal models over detailed models, with no significant loss in the representation of key performance parameters or radiation vulnerability. The linear modeling technique suggests that photocompensation networks can be applied successfully at the terminals of the device.Keywords
This publication has 3 references indexed in Scilit:
- Simplified Microcircuit ModelingIEEE Transactions on Nuclear Science, 1971
- Component Vulnerability Analysis of MicrocircuitsIEEE Transactions on Nuclear Science, 1970
- Characterization and Modeling of the 709 Integrated Circuit Operational Amplifier in an Ionizing Radiation EnvironmentIEEE Transactions on Nuclear Science, 1969