Measurement of Elastic Strains in Crystal Surfaces by X-Ray Diffraction Topography
- 1 January 1968
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- A study of strains in abraded diamond surfacesProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1967
- Precipitation Effects in Diffused Transistor StructuresJournal of Applied Physics, 1966
- X-Ray Extinction Contrast Topography of Silicon Strained by Thin Surface FilmsJournal of Applied Physics, 1965
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- Direct Determination of X-Ray Reflection Phase Relationships Through Simultaneous ReflectionPhysical Review Letters, 1961
- Studies of Individual Dislocations in Crystals by X-Ray Diffraction MicroradiographyJournal of Applied Physics, 1959
- A study of pendellösung fringes in X-ray diffractionActa Crystallographica, 1959