A common cause failure availability model
- 1 January 1978
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 17 (6) , 583-584
- https://doi.org/10.1016/0026-2714(78)90439-0
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Effects of Weibull hazard rate on common cause failure analysis of reliability networksMicroelectronics Reliability, 1978
- A 4-Unit Redundant System with Common-Cause FailuresIEEE Transactions on Reliability, 1977
- Common mode failure analysisIEEE Transactions on Power Apparatus and Systems, 1975