Circular self-test path: a low-cost BIST technique for VLSI circuits
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 8 (1) , 46-55
- https://doi.org/10.1109/43.21818
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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