A full wave simulation of disturbances in picosecond signals by electro-optic probing
- 2 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 0149645X,p. 665-668
- https://doi.org/10.1109/mwsym.1992.188071
Abstract
Disturbances induced in electric fields near coplanar waveguides by electrooptic dielectric sampling probes were studied by using a three-dimensional finite-difference time-domain technique. Probing effects on the waveguide S-parameters were characterized and the signal field distortion in the optical tip was calculated. It was that probes can have a significant effect on measurement accuracy in the subpicosecond domain. Optical samples taken near the edge of the probe can result in measurements with less distortion than those taken at the center.Keywords
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