Two-dimensional field mapping in coplanar MMIC-components using direct electro-optic probing

This publication has 10 references indexed in Scilit:

• Two-dimensional field mapping in MMIC-substrates by electro-optic sampling technique
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Probe tip invasiveness at indirect electro-optic sampling of MMIC
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Electro-optic sampling of nonlinear effects in Schottky coplanar lines
  Microelectronic Engineering, 1992
• Optoelectronic transient characterization of ultrafast devices
  IEEE Journal of Quantum Electronics, 1992
• Measurements on standing waves in GaAs coplanar waveguide at frequencies up to 20.1 GHz by electro-optic probing
  Journal of Applied Physics, 1988
• Picosecond optical sampling of GaAs integrated circuits
  IEEE Journal of Quantum Electronics, 1988
• Electro-optic sampling measurement of coplanar waveguide (coupled slot line) modes
  Electronics Letters, 1987
• Internal Microwave Propagation and Distortion Characteristics of Traveling-Wave Amplifiers Studied by Electrooptic Sampling
  IEEE Transactions on Microwave Theory and Techniques, 1986
• Electrooptic sampling in GaAs integrated circuits
  IEEE Journal of Quantum Electronics, 1986
• Subpicosecond electrooptic sampling: Principles and applications
  IEEE Journal of Quantum Electronics, 1986