In-situ elevated temperature imaging of thin films with a microfabricated hot stage for scanning probe microscopes
- 1 March 1999
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 141 (1-2) , 119-128
- https://doi.org/10.1016/s0169-4332(98)00603-5
Abstract
No abstract availableKeywords
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