Texture control and interfacial structures of SrBi2Ta2O9 thin films on Pt

The influence of the Pt bottom electrode orientation on the growth of ${\mathrm{SrBi}}_{\mathrm{2}}{\mathrm{Ta}}_{\mathrm{2}}{\mathrm{O}}_{\mathrm{9}}$ (SBT) films was elucidated in terms of the atomic matching at the SBT/Pt interfaces. A highly c-axis oriented SBT film was grown on the Pt (001) plane since the SBT $\text{(00l)}$ plane conjugates well with the Pt (001) plane from a crystallographic point of view. Both the strong ${\text{(105)}}_{\mathrm{tet}}$ and ${\text{(110)}}_{\mathrm{tet}}$ SBT peaks were found in the x-ray diffraction profile when the SBT film was grown on the Pt (111) surface. It was found that not a single SBT plane can match with the whole Pt (111) plane due to the appreciably different atomic configurations. The cross-sectional transmission electron microscopy image revealed that the SBT/Pt interface was structurally stable after heat treatment at 750 °C.