Scanning Electron Diffraction Observations on Diffuse Inner Rings from Very Thin Vapor-Deposited Films
- 1 January 1967
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 38 (1) , 99-102
- https://doi.org/10.1063/1.1709018
Abstract
Observations on small-angle diffraction rings from very thin vapor-deposited layers have been carried out using a direct-recording electron diffractometer. The rings are due to the island structure of the deposited layers. A detailed correlation has been made between ring location and island/island interferences by statistical evaluation of electron micrographs. (The occurrence of inner diffraction rings from various types of specimens was first noted by Mahl and Weitsch using an electron-microscope technique.)This publication has 4 references indexed in Scilit:
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- Improved Scanning Electron Diffraction SystemReview of Scientific Instruments, 1965
- Scanning electron diffraction with energy analysisJournal of Scientific Instruments, 1965
- Kleinwinkelbeugung mit ElektronenstrahlenZeitschrift für Naturforschung A, 1960