Observation of heavy ion induced transients in linear circuits
- 24 August 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Heavy ion test results on memoriesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Observation of single event upsets in analog microcircuitsIEEE Transactions on Nuclear Science, 1993