Defect level as a function of fault coverage and yield
- 31 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 507-508
- https://doi.org/10.1109/etc.1993.246604
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Critical areas for finite length conductorsMicroelectronics Reliability, 1992
- Integrated circuit yield statisticsProceedings of the IEEE, 1983
- Defect Level as a Function of Fault CoverageIEEE Transactions on Computers, 1981