Very-Low Voltage (VLV) and VLV Ratio (VLVR) Testing for Quality, Reliability, and Outlier Detection
- 1 October 2006
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE) in 2006 IEEE International Test Conference
- No. 10893539,p. 1-6
- https://doi.org/10.1109/test.2006.297690
Abstract
A new implementation of very-low voltage (VLV) and minimum voltage (Min_Vdd) testing, the VLV ratio test (VLVR) is proposed to improve product quality and reliability by detecting fabrication and test outliers. The VLVR technique was also used to assist in the diagnosis of a stress induced failure mechanism in a 0.13 micron low power (LP) CMOS processKeywords
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