Specimen Holder for High Temperature Electron Transport Property Measurements
- 1 April 1970
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 41 (4) , 593-594
- https://doi.org/10.1063/1.1684590
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Electrical Properties and Defect Structure of Y2O3Journal of the American Ceramic Society, 1966
- Servo-Controlled Measuring Bridge for Semiconductors of High ResistivityReview of Scientific Instruments, 1965
- Apparatus for the Measurement of Galvanomagnetic Effects in High Resistance SemiconductorsReview of Scientific Instruments, 1961