Influence of concentration gradients and surface roughness on measured reduced thicknesses of overlayers
- 31 December 1987
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 42 (1) , 61-66
- https://doi.org/10.1016/0368-2048(87)85006-5
Abstract
No abstract availableKeywords
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