Exciton dynamics in solid neon

Publisher Website
Google Scholar
Abstract
In this paper we report the results of an experimental study of the photoelectric yield of pure and doped solid Ne in the extreme ultraviolet (h/ω=8–30 eV) by use of synchrotron radiation from the DESY synchrotron. Results for the range of impurity excitations, exciton states, and interband transitions were obtained for Xe in Ne, Kr in Ne, and Ar in Ne. The photoemission data where utilized to extract new information concerning (a) energetics, (b) nonradiative relaxation phenomena, and (c) exciton dynamics in solid Ne. Concerning (a) a definite value for the electron affinity V0 in solid Ne was established experimentally. Concerning (b) we were able to show that the n=2 (1/2) exciton decays in an Auger‐type process into an ionized impurity in the (3/2) state and a free electron on a time scale τ (Auger) ?10−13 sec, which is comparable or even shorter than the n=2→n=1 nonradiative relaxation process. Concerning (c) the analysis of the energy dependent photoemission line shape at different film thicknesses resulted in information concerning the diffusion length of excitons and escape length of electrons in solid Ne.