Batstone and Phillips Reply

Publisher Website

7 November 1988

journal article
research article
Published by American Physical Society (APS) in Physical Review Letters

Vol. 61 (19) , 2275
https://doi.org/10.1103/physrevlett.61.2275

Abstract

DOI: https://doi.org/10.1103/PhysRevLett.61.2275

Keywords

This publication has 8 references indexed in Scilit:

Structural Characterization of the Si(111)-Ca $F_{2}$ Interface by High-Resolution Transmission Electron Microscopy
Physical Review Letters, 1988
Structure of the Si(111)-Ca $F_{2}$ Interface
Physical Review Letters, 1988
Evidence for the influence of interfacial atomic structure on electrical properties at the epitaxial ${CaF}_{2}$ /Si(111) interface
Physical Review Letters, 1988
Photoemission study of bonding at the ${CaF}_{2}$ -on-Si(111) interface
Physical Review B, 1987
Effect of Atomic Structure at the Epitaxial CaF₂ /Si(111) Interface on Electrical Properties
MRS Proceedings, 1987
The atomic structure of the NiSi₂-(001)Si interface
Philosophical Magazine A, 1984
Direct determination of atomic structure at the epitaxial cobalt disilicide on (111) Si interface by ultrahigh resolution electron microscopy
Applied Physics Letters, 1982
Atomic structure of the NiSi₂/(111)Si interface
Philosophical Magazine A, 1982