Trimming phase and birefringence errors in photosensitivity-locked planar optical circuits
- 7 August 2002
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Photonics Technology Letters
- Vol. 14 (1) , 71-73
- https://doi.org/10.1109/68.974165
Abstract
A strong and stable photosensitivity response was permanently locked into hydrogen-loaded Mach-Zehnder planar waveguide circuits by 248-nm KrF-laser preirradiation. The photosensitivity enhancement survived thermal annealing up to 225 /spl deg/C. Post-laser trimming at 248 nm induced an unsaturated refractive index increase of 0.002, and a birefringence change of /spl utri/n /spl sim/ 0.0001. This combination of photosensitivity locking and post-laser tuning affords wide latitude for precise and stable tuning of waveguide phase errors and birefringence.Keywords
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