Mechanical damage induced luminescence band in GaAs
- 15 February 1985
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 57 (4) , 1387-1390
- https://doi.org/10.1063/1.334492
Abstract
In this paper we report the observation of a new luminescence band at ∼1.4 eV in the low temperature (10 K) spectrum from bulk GaAs crystals when they are subjected to surface damage by saw cutting, mechanical polishing, and scribing. The band is observed in all crystals, independent of the growth method, dopant, and conductivity type. The peak position of the 1.4-eV band shifts to lower energy with decreasing excitation intensity by as much as 7 meV per decade change in excitation power. The luminescence quenches thermally above ∼30 K with an activation energy of 33±7 meV. We suggest that this new luminescence is a donor-acceptor pair transition involving defects introduced by the surface damage. The mechanical damage, as monitored by the intensity of the luminescence band, is found to extend into the crystal by 10–20 μm depending on the severity of the damage, and it anneals out at ≳400 °C.This publication has 21 references indexed in Scilit:
- Photoluminescence evaluation of semi-insulating GaAs grown by the liquid encapsulated Czochralski techniqueJournal of Applied Physics, 1982
- Photoluminescence studies of surface damage states in InPSurface Science, 1981
- The luminescence of defects introduced by mechanical damage of InPJournal of Applied Physics, 1981
- Defect distribution near abraded surface of III?V compound semiconductorsJournal of Materials Science, 1980
- Some optical properties of the AlxGa1−xAs alloys systemJournal of Applied Physics, 1976
- Dependence of photoluminescence of n-GaAs on surface treatmentSolid State Communications, 1973
- Polishing Damage and Luminescence in p‐Type GaAsPhysica Status Solidi (b), 1969
- Stress Dependence of Photoluminescence in GaAsPhysical Review B, 1967
- Pair Spectra and "Edge" Emission in Gallium PhosphidePhysical Review B, 1964
- Dislocations and brittle fracture in elemental and compound semiconductorsActa Metallurgica, 1960