Identifying risk using ODC based growth models
- 17 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
The paper uses the relative growth of defects, classified using orthogonal defect classification to get a finer insight into dynamics of the software development process during later parts of testing. This is particularly useful to help identify management actions to better use people resources (both skill and staffing levels) to respond to difficulties experienced with the product in test. Specifically, the technique helps to: identify the reasons for instability in the product demonstrated by growth modelling. Evaluate the relative stability of specific aspects of the product, such as design, code, etc. Guide the choice of resource levels and skills necessary to respond to difficulties faced in the development process.Keywords
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