Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy
- 27 April 2009
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 94 (17) , 171104
- https://doi.org/10.1063/1.3126053
Abstract
Propagation of terahertz waves in hollow metallic waveguides depends on the waveguide mode. Near-field scanning probe terahertz microscopy is applied to identify the mode structure and composition in dielectric-lined hollow metallic waveguides. Spatial profiles, relative amplitudes, and group velocities of three main waveguide modes are experimentally measured and matched to the HE 11 , HE 12 , and TE 11 modes. The combination of near-field microscopy with terahertz time-resolved spectroscopy opens the possibility of waveguide mode characterization in the terahertz band.Keywords
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