Development of single-particle detectors for keV ions
- 1 June 1982
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 53 (6) , 829-837
- https://doi.org/10.1063/1.1137055
Abstract
A series of three single‐particle detectors for the detection of ions with keV energies has been built and investigated by experiment and by computer simulation. The incident ions hit a converter electrode and produce secondary electrons which are accelerated onto the funnel of a channel electron multiplier (CEM). Experimental information was obtained for secondary electron yields, γ, of slow multiply charged ions and the influence of γ on the detector efficiency ε is discussed. Efficiencies ε near unity have been achieved for ions incident on an effective area of more than 20 mm diameter. ε is greater than 90% for all ions and for count rates up to 3×104 s−1. The performance at higher count rates can probably be improved with a CEM of lower resistance.Keywords
This publication has 7 references indexed in Scilit:
- Single particle counting of heavy ions with a channeltron detectorNuclear Instruments and Methods, 1980
- An experimental study of charge transfer and ionisation in Cs+-Cs+collisionsJournal of Physics B: Atomic and Molecular Physics, 1979
- Production of isotope-resolved beams of highly charged xenon ionsNuclear Instruments and Methods, 1979
- Secondary electron yield in the Bendix channel electron multiplierNuclear Instruments and Methods, 1977
- Secondary Electron Yield vs Primary Energy for Commercial Coated-Glass Resistance StripsReview of Scientific Instruments, 1969
- Elektronenemission von intermetallischen Verbindungen bei IonenbeschußThe European Physical Journal A, 1967
- Scintillation Type Mass Spectrometer Ion DetectorReview of Scientific Instruments, 1960