The impact of device type and sizing on phase noise mechanisms [MOS VCOs]
- 3 February 2004
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- MOSFET modeling for low noise, RF circuit designPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Frequency dependence on bias current in 5 GHz CMOS VCOs: impact on tuning range and flicker noise upconversionIEEE Journal of Solid-State Circuits, 2002
- A filtering technique to lower LC oscillator phase noiseIEEE Journal of Solid-State Circuits, 2001
- Phase noise degradation at high oscillation amplitudes in LC-tuned VCO'sIEEE Journal of Solid-State Circuits, 2000
- A general theory of phase noise in electrical oscillatorsIEEE Journal of Solid-State Circuits, 1998
- MOSFET thermal noise modeling for analog integrated circuitsIEEE Journal of Solid-State Circuits, 1994