An approach to functional level testability analysis
- 13 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Controllability/observability analysis of digital circuitsIEEE Transactions on Circuits and Systems, 1979
- Binary Decision DiagramsIEEE Transactions on Computers, 1978
- Probabilistic Treatment of General Combinational NetworksIEEE Transactions on Computers, 1975