Vanishing Voltages of the Second Order Reflection in Electron Diffraction
- 1 May 1969
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 8 (5) , 621
- https://doi.org/10.1143/jjap.8.621
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A new method of determining the atom form factor by high-voltage electron diffraction. An application of the effect of vanishing of the second-order reflexionActa Crystallographica Section A, 1968
- An apparent variation of structure factors for electrons with the accelerating voltage. An observation through Kikuchi patternsActa Crystallographica Section A, 1968
- Dynamical effects in high-voltage electron diffractionActa Crystallographica Section A, 1968
- Theorie der Beugung von Elektronen an KristallenAnnalen der Physik, 1928