The wafer flexure technique for the determination of the transverse piezoelectric coefficient (d31) of PZT thin films
- 1 November 1998
- journal article
- Published by Elsevier in Sensors and Actuators A: Physical
- Vol. 71 (1-2) , 133-138
- https://doi.org/10.1016/s0924-4247(98)00161-7
Abstract
No abstract availableKeywords
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