Quaternary alloy InxGa1−xAsyP1−y/InP photodetectors

Abstract
Acceptor‐doped heteroepitaxial In0.84Ga0.16As0.34P0.66 layers grown on donor‐doped InP substrates were used to construct self‐filtering infrared detectors with a responsivity of 0.46 A/W at a wavelength λ=1.05 μm and a corresponding external quantum efficiency ηx=0.54.

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