Six-port and four-port reflectometers for complex permittivity measurements at submillimeter wavelengths

This publication has 7 references indexed in Scilit:

• The measurement of the properties of materials
  Proceedings of the IEEE, 1986
• A Six-Port Reflectometer Operating at Submillimeter Wavelengths
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1985
• Dielectric Measurements of Millimeter-Wave Materials
  IEEE Transactions on Microwave Theory and Techniques, 1984
• Two-beam interferometer for optical constants measurements at near-millimeter wavelengths
  International Journal of Infrared and Millimeter Waves, 1984
• Mehrtoranordnungen in der Mikrowellen-Impedanzmeßtechnik / Multiport devices for the measurement of impedance in the microwave region
  TM - Technisches Messen, 1980
• An Improved Circuit for Implementing the Six-Port Technique of Microwave Measurements
  IEEE Transactions on Microwave Theory and Techniques, 1977
• A TE01n Cavity Resonator Method to Determine the Complex Permittivity of Low Loss Liquids at Millimeter Wavelengths
  Review of Scientific Instruments, 1973