The measurement of the properties of materials
- 1 January 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
- Vol. 74 (1) , 183-199
- https://doi.org/10.1109/proc.1986.13432
Abstract
This review covers approximately 15 years of development in the techniques used to measure dielectric properties of materials over the frequency range 1 MHz to 1500 GHz. An introductory section summarizes the broad development trends and is followed by short sections which deal with developments at a more detailed level. The approaches described include time- and frequency-domain methods; reflection, transmission, and resonant methods, guided and free-space methods; discrete-frequency and broad-band methods, especially Fourier Transform Spectroscopy. Measurements on magnetic materials are also briefly discussed.Keywords
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