Precise measurement of dielectric properties at very high frequencies
- 1 October 1975
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 46 (10) , 1338-1341
- https://doi.org/10.1063/1.1134068
Abstract
This paper describes an improved method and apparatuses based on it for the measurement of the dielectric constant and the dissipation factor at very high frequencies. This method is a combination of the Hartshorn and Ward, Lynch, and liquid immersion methods. The direct purpose is to measure low‐loss polyethylene which is to be used in submarine telephone cables at 36 and 100 MHz in Japan. By using a 0.5∼2.0 mm thick disk specimen, the dielectric constant can be measured to an accuracy of 0.3%, the dissipation factor to several μrad, and the mean thickness to several μ without any kind of correction. The three equations for them are simple and independent of the frequency. This method is easy to use and takes little time, for the values to be measured for each specimen are only three in a series of measurements, and the mechanical thickness measurements are not required.Keywords
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