Correlation Between Thick-Film Resistance Values
- 1 June 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Parts, Hybrids, and Packaging
- Vol. 13 (2) , 138-143
- https://doi.org/10.1109/tphp.1977.1135192
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Statistical Circuit Design: Characterization and Modeling for Statistical DesignBell System Technical Journal, 1971
- An outline of design techniques for linear integrated circuitsIEEE Journal of Solid-State Circuits, 1969