Transition Characterisation for De-Embedding Purposes
- 1 October 1987
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 355-360
- https://doi.org/10.1109/euma.1987.333752
Abstract
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This publication has 1 reference indexed in Scilit:
- Direct Calibration and Measurement of Microstrip Structures on Gallium ArsenidePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005